Coinage Metal 4+1 Kernels

A/B/C Test: Cu vs Ag vs Au Electron Trap Dynamics

Copper 29
IDLE
[Ar] 3d¹⁰ 4s¹ + 1e⁻ → Frozen
Trap Depth
1.35 eV
D Value
0.000
OUT Current
0.00 µA
Leak Rate
4.37e-77 /s
Silver 47
IDLE
[Kr] 4d¹⁰ 5s¹ + 1e⁻ → Perfect Hold 15µs
Trap Depth
0.65 eV
D Value
0.000
OUT Current
0.00 µA
Leak Rate
2.86e-31 /s
Gold 79
IDLE
[Xe] 4f¹⁴ 5d¹⁰ 6s¹ + 1e⁻ → Immediate Leak
Trap Depth
0.30 eV
D Value
0.000
OUT Current
0.00 µA
Leak Rate
2.31e-8 /s

README: Coinage Metal 4+1 Kernel Comparison

Overview

This simulation demonstrates the "4+1" electron configuration model for Group 11 transition metals. Each kernel consists of a noble gas core, a filled d¹⁰ shield, and a single s¹ valence electron. The experiment injects an additional "laser" electron to test trap dynamics.

Electron Configurations

Element Z Core d-Shield s-Electron Trap Depth Behavior
Cu 29 [Ar] 3d¹⁰ 4s¹ 1.35 eV Deep trap: electron freezes, cannot tunnel
Ag 47 [Kr] 4d¹⁰ 5s¹ 0.65 eV Optimal: stable hold ~15µs at 77K
Au 79 [Xe]4f¹⁴ 5d¹⁰ 6s¹ 0.30 eV Shallow: immediate thermal leak

Controls

Metrics Explained

Key Findings

Copper: The 1.35eV trap is too deep. The injected electron becomes frozen in the lattice and cannot be extracted, resulting in ~0µA output. Useful for permanent storage but not switching.

Silver: The 0.65eV "Goldilocks zone" allows the electron to be held metastably for ~15µs at 77K before thermal emission. This matches experimental data for Ag-based quantum dots. Produces reliable 1.0µA pulses on readout.

Gold: At 0.30eV, the trap is shallower than kT at 77K ≈ 0.0066eV. Thermal fluctuations immediately eject the electron in <100ns. High leak rate, unstable output.

Temperature Dependence

Leak rate follows Arrhenius: Rate ∝ exp(-E_depth / kT). At 77K liquid nitrogen temperature, kT = 0.0066eV. At 300K room temp, kT = 0.026eV, making Au completely unusable and reducing Ag hold to ~2µs.